Image
Code
XPS2 (Coming Soon)
Model
Thermo Scientific Nexsa G2
Location
X-Ray Characterization
Helpful Links
XPS is a powerful surface analysis technique for the detection of elements and variations in chemical compositions and oxidation states. Subtle changes in peak positions and shapes can yield important information on changes in surface chemistry.
Features
- Micro-focused X-Ray monochromater with 10um minimum analysis area
- Automated Ion Scattering Spectroscopy (ISS) for ultra sensitive surface analysis
- Automated Ultraviolet Photoelectron Spectroscopy (UPS) for valence band analysis
- Reflected Electron Energy Loss Spectroscopy (REELS)
- Charge neutralization through a combined low-energy electron/ion flood source
- Monatomic & Gas Cluster Ion Source (MAGCIS) for depth profiling of both hard and soft materials
- Sample stages for tilt, heating, and vacuum transfer
Specifications
- X-Ray source type: Monochromated, micro-focused, low-power Al K-Alpha X-ray source
- X-Ray spot size: 0–400 µm (adjustable in 5 µm steps)
- Maximum sample area: 60 x 60 mm
- Maximum sample thickness: 20 mm