Scanning Electron Microscope with EDS Detector

Scanning Electron Microscope with EDS Detector
Apreo S by ThermoFisher Scientific (formerly FEI)
Electron Microscopes
Primary Training Contact

General training:Justin Gladman 

EDS & STEM training:Talmage Tyler

Operating Procedures

The Thermo Scientific™ Apreo scanning electron microscope's revolutionary compound lens design combines electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection. This makes the Apreo SEM the platform of choice for research on nanoparticles, catalysts, powders and nanodevices, without compromising on magnetic sample performance.


The Apreo SEM benefits from the unique in-lens backscatter detection, which provides excellent materials contrast.  The novel compound lens further improves contrast with energy filtering and adds charge filtering for imaging of insulating samples.

  • High resolution imaging
  • Energy dispersive X-ray analysis and mapping
  • Large capacity 5-axis stage with Nav-Cam visual navigation, greatly increasing ease of use and sample throughput
  • Beam current range: 0.78pA - 100nA
  • Accelerating voltage up to 30kV, with landing energy as low as 20eV
  • Everhart-Thornley detector (with secondary and backscatter modes)
  • Three in-column detectors, including in-lens backscatter detection
  • Compound final lens comprised of external electrostatic and magnetic lenses for maximum resolution, as well as energy filtering for improved materials contrast and charge-free imaging of insulating samples
  • Sub-nanometer imaging resolution at high kV; ~ 1nm resolution at 1kV
  • Directional backscatter (DBS) detector
  • Scanning transmission electron microscopy (STEM) detector
  • EDS: Oxford Instruments X-Max-N 150 SDD with 127eV resolution