The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research and industrial R&D laboratories.
- 100um x-y range, 12um z-range
- Vacuum chuck for wafers up to 200mm
- Liquid stage for working with samples in liquid