Focused Ion Beam (OPENING SOON!)

Image
FIB1
Code
FIB1
Model
Helios 5 CX
Location
Electron Microscopes
Primary Training Contact

Zhennan Huang (General) 

Lydia Parks (Nanopatterning)

Applications
  • TEM and APT sample preparation.
  • 3D reconstruction with Auto Slice & View
  • High flexibility 110 mm stage, multi-purpose sample holder and Nav-Cam+
  • Gatan EDS and EBSD detectors
  • CleanConnect quick loader for rapid and air-tight sample transfer
  • Quorum Cryo System for cryogenic imaging and FiB Milling
  • W and Pt deposition sources
Specifications
  • Imaging resolution down to 1nm
  • Milling and deposition resolution < 10nm