Scanning Electron Microscope

Code: 
SEM1
Model: 
FEI XL30 SEM-FEG
Location: 
Electron Microscopes
Primary Training Contact: 

The FEI XL30 SEM offers ultra high resolution secondary electron imaging of a variety of samples. It can achieve magnifications of over 300,000X and has excellent depth of field. Minimal sample preparation is required because the highly coherent  beam produced by the field emission gun allows the use of very low beam voltages for imaging.

Applications: 
  • High Resolution Imaging
Features: 
  • True secondary electron imaging
  • Minimal charging of non-conductive samples
  • Low-Z materials
  • X,Y,Z, Rotation and Tilt movement
Specifications: 
  • ~ 2-3nm (Imaging)