The FEI XL30 SEM offers ultra high resolution secondary electron imaging of a variety of samples. It can achieve magnifications of over 300,000X and has excellent depth of field. Minimal sample preparation is required because the highly coherent beam produced by the field emission gun allows the use of very low beam voltages for imaging.
- High Resolution Imaging
- True secondary electron imaging
- Minimal charging of non-conductive samples
- Low-Z materials
- X,Y,Z, Rotation and Tilt movement
- ~ 2-3nm (Imaging)